TIME1150 adalah detektor cacat ultrasonik digital terbaik yang diproduksi oleh TIME Group Inc.
● Layar TFT warna VGA 5,7 inci dan konektor probe LEMO/BNC.
● Rentang pengukuran yang luas dari 1-10000 mm.
● Linearitas horizontal dan vertikal yang presisi dan stabil dengan linearitas horizontal 0,1% dan linearitas vertikal 2%.
● Kurva DAC, AVG, DGS, dan echo defek membantu mengevaluasi perhitungan ekuivalen defek.
● Tampilan simultan gelombang A-scan dan B-scan resolusi tinggi.
● Empat cara untuk menampilkan bentuk gelombang: setengah gelombang positif, setengah gelombang negatif, gelombang penuh, dan frekuensi radio.
● Penyesuaian penguatan otomatis, perhitungan setara cacat, dan fungsi memori puncak.
● Dua pengaturan gerbang individual dan fungsi alarm.
● Pengukuran gerbang mencakup amplitudo gema, jalur pancaran, kedalaman, proyeksi, dan sebagainya.
● Pembekuan bentuk gelombang tersedia: dalam bentuk penuh, puncak, komparatif, dan amplop.
● Tersedia 50 saluran deteksi dengan parameter deteksi terpisah dan kurva DAC (Koreksi Amplitudo Jarak) di setiap saluran.
● Generator pulsa gelombang persegi berkinerja tinggi yang dapat disesuaikan
● Tiga mode deteksi (probe tunggal, probe kristal ganda, dan transmisi) dengan fungsi kalibrasi otomatis.
● Terhubung ke PC melalui antarmuka USB dengan perangkat lunak canggih untuk analisis dan manajemen data.
● Memori super besar, dapat menyimpan 1000 bentuk gelombang dan 4X2000 diagram bentuk gelombang dinamis, dengan fungsi penyimpanan, pengecekan, dan peninjauan saluran, bentuk gelombang, dan rekaman dinamis.
● Laporan deteksi cacat dapat dicetak.
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Operating temperature |
-10℃~+50℃ |
|
Storage temperature |
-20℃~+60℃ |
|
Language |
English/Chinese/Spanish selectable |
|
Probe socket |
LEMO or BNC |
|
Battery (mAh) |
2×3.7V 5000mAh |
|
Battery working time |
>8h |
|
Charging time (h) |
<8h |
|
Power adapter Input |
100-240~50/60Hz |
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Output |
9V DC/3A~4A |
|
LCD |
Color transmission TFT, 640×480 |
|
Dimension (mm) |
177X255X51 |
|
Weight (g) |
1200 |
| Basic |
Receiver |
||
| Measuring unit |
mm/inch/μs |
Gain (dB) |
0~110 |
| Scanning range (mm) |
0-10000 |
Bandwidth (MHz) |
0.5~15 |
| Sound velocity (m/s) |
600-16000 |
Rectify |
Positive half wave, negative half wave, full and RF |
| P-delay (μs) |
-1.000~750.000 |
Vertical linearity accuracy |
±2% |
| D-delay (μs) |
-20~+3400 |
Amplifier resolution (dB) |
±1 |
| Test mode |
Pulse-echo, dual and through transmission |
Rejection (1%) |
Linear, 0~80% of the full screen |
| Scanning mode |
A scan and B scan, displaying both simultaneously |
Sampling frequency (MHz) |
80 |
| Pulse generator |
Crosstalk rejection (dB) |
≥80 |
|
| Pulser (V) |
Square pulse |
Dead zone (μs) |
≤10 (related with transmitting) |
| Transmitting voltage |
100~400(V) variable in steps of 10V |
Dynamic range (dB) |
≥40 |
| Transmitting pulse width (ns) |
75/100~500 variable in steps of 50ns |
Instant resolution (dB) |
≥32 |
| Damping (Ω) |
50/100/200/500 |
Time base linearity |
<±0.2% full screen |
| Pulse repetition frequency (Hz) |
10~1000 |
Sensitivity leavings (dB) |
≥62 |
|
Measurements and others |
Data management, communication and print |
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Gate |
2 indepent gates |
Data storage |
50 channels |
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Testing position |
Edge, Peak value |
1000 wave images (including 980 A scan images and 20 B scan images) |
|
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Gate measurements |
Echo amplitude, Sound path, depth, projection etc. |
4×2000 dynamic wave image |
|
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Freeze |
Freeze waveform, peak value, comparative and envelope |
Store, review or replay the channels, waves |
|
|
AVG equivalent calculate |
Calculate the flaw equivalent according to the flaw echo and AVG curve |
All the data can be stored to PC or flash disk |
|
|
DAC flaw evaluating |
Make flaw evaluation according to flaw echo and DAC curve |
Communication |
Communicate with PC via USB interface |
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Gate logic |
Off, measurement, gate positive wave alarm, gate negative wave alarm |
Printing |
Print report |
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Gate alarm |
off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock |
Outout port |
|
|
Alarm |
on/off |
USB OTG port |
USB 2.0 device connected with PC |
Alat Uji
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